FEI

SEM-Scanning Electron Microscopes (SEM) are used for inspecting topographies of materials with a magnification range that encompasses that of optical microscopy and extends it to the nanoscale. TEM FEI's market-leading transmission electron microscopes (TEM) feature fully integrated and automated operation for a range of applications requiring ultra-high resolution to sub-Ångström levels. DualBeam FEI's DualBeam (FIB/SEM) systems are the preferred solution for 3D microscopy and analysis serving material characterization, industrial failure analysis and process control applications. FIB Reveal below-the-surface defects in materials and devices. A focused ion beam system (FIB) is a tool that has a high degree of analogy with a focused electron beam system such as a scanning electron microscope. Materials ScienceSemiconductorsLife SciencesOil and GasIndustrial Manufacturing Industrial Manufacturing